XSCAN-H160

XSCAN-H160 Product Introduction High-performance, High-magnification, High-resolution inspection system Focus size ; 1 › Provided World’ s first dual C/ T function ( Normal CT, Oblique CT) Geometric Magnification 2000 twice Precision Inspection system for Semiconductor, SMT. Main Features ½ High performance Inspection system Focus size : 1 › Voltage : 160kV ( Open tube) Current : 1000‚ Detector : 5” FPD Dual C/ T: Cone beam and Oblique C/ T ½ User-friendly and easy-to-use Live image quality improvement function Visual error messages. Application ½ Semiconductor, high- precision electronic parts Semiconductor MCP, Flip-Chip, COC ( Chip on chip) ¼ BGA, CSP, ACF, FPCB Automobile sensor ABS, TCS, ECU SMD/ MLB Extra lightweight, extra accurate magnesium alloy etc. Engineering Plastic injected products Connector, wire harnes.